New Epsilon 3 Benchtop Spectrometers  

The new range of Epsilon 3 benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometers from PANanalytical (The Netherlands) are able to deliver accurate, precise and reliable results. The light-element performance, full data traceability and a variety of software options allow for rapid identification fingerprinting or regulatory compliance. The new Epsilon 3 instruments offer cost-effective and capable alternatives for a wide variety of applications and industries.

Simon Milner, Product Marketing Manager X-ray Spectrometry, explains how Epsilon 3 designers have managed to take benchtop EDXRF spectrometry to the next performance level; “Selective excitation and careful matching of the X-ray tube output to the capabilities of the detection system underlie system performance. Advanced spectrum processing and unique correction and quantification algorithms ensure data accuracy and precision. The result is an affordable, highly flexible analytical tool suitable for applications in cement production, mining, mineral beneficiation, petroleum, polymers and related industries”.

Epsilon 3 features a new high-performance ceramic tube that has been developed specifically for this system. In addition, the range utilises the latest in silicon drift detector technology. Thin windows on both X-ray tube and detector enable light element analysis down to fluorine. Sample preparation is straightforward and a variety of sample types can be measured, for example, solids, pressed and loose powders, liquids and filter samples weighing from a few grams to larger bulk samples.