Comprehensive SENSOR+TEST Conferences Against the Trend

The SENSOR+TEST (Germany) Conferences are held biannually in the odd years, traditionally complementing the SENSOR+TEST trade fair at the Nürnberg Exhibition Centre. Thus, the three international conferences, SENSOR, OPTO, and IRS², will again offer a comprehensive overview of the state of the art in research and development in the areas of sensor technology, optical and infrared measurement.

The conferences are again ably chaired by Prof. Dr. R. Lerch (University of Erlangen-Nürnberg) jointly with Prof. Dr. R. Werthschützky (TU Darmstadt) for the SENSOR Congress, Prof. Dr. E. Wagner (Fraunhofer Institute IPM, Freiburg) for the OPTO Congress, and Prof. Dr. G. Gerlach (TU Dresden) for the IRS² Congress. The complete agenda for all three conferences is available on the web. They are as comprehensive as never before: About 230 (!) papers and posters are being offered during the three-day sessions.

Prof. Lerch commented: “The scientific conferences at the SENSOR+TEST are well established as a permanent component of the international measuring technology scene. In times when other events are suffering from a decreasing number of participants, we were in fact able to expand our conferences. The SENSOR Conference, for instance, will have four parallel sessions this year, instead of three as in the past. The topics range from basic sensor principles to novel manufacturing methods. The conferences are of interest for both, sensor developers and users in the area of automation technology.”

The SENSOR+TEST Conferences 2011 will start jointly on the first day of the fair with an opening lecture by Prof. Dr. E. Göbel, President of the National Metrology Institute (Physikalisch-Technischen Bundesanstalt) in Braunschweig, on the subject of “Fundamental Constants and the New International System of Units (SI).” Also, the AMA Association’s 10,000-Euro SENSOR Innovation Award will again be presented during the opening ceremony.