• Advantages of Using ED-XRF Spectrometers for the Field Analysis of Soil and Sewage Sludge are Detailed in New Application Brief

Environmental Laboratory

Advantages of Using ED-XRF Spectrometers for the Field Analysis of Soil and Sewage Sludge are Detailed in New Application Brief

Sep 28 2015

A new application brief detailing the advantages of using energy dispersive X-ray fluorescence (ED-XRF) spectrometers to perform elemental analysis in the field on soil and sewage sludge samples is available to download from Spectro Analytical Instruments' (Germany) website.

Determining the best course of action when addressing a contaminated environmental site requires both a precise identification of the contaminating elements and a determination of the amounts present. Traditionally, this elemental analysis has been done in laboratories using inductively coupled plasma-optical emission spectrometry (ICP-OES). But transporting soil and sewage sludge samples back and forth from the field to a laboratory adds considerable time and cost to the remediation process.

The new brief, “Analysis of Soil and Sewage Sludge in the Field with a Portable ED-XRF Spectrometer,” describes dramatic new improvements in portable ED-XRF spectrometers that enable environmental professionals to rapidly characterise samples in remote areas with minimal preparation and with very high accuracy of analysis in environmental monitoring, geochemical prospecting, and mining applications. The benefits versus laboratory-based elemental analysis include speed, precision, accuracy and cost-effectiveness.

The brief also outlines key factors to consider when comparing various portable ED-XRF spectrometers and their variations in performance, ease of use, and suitability for the field analysis of soil and sewage sludge samples.

Download the new brief, “Analysis of Soil and Sewage Sludge in the Field with a Portable ED-XRF Spectrometer,” today. The brief is authored by SPECTRO Analytical Instruments, a leading global supplier of analytical instruments for optical emission and X-ray fluorescence spectrometry.


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